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Produktbild: Sirohi, R: Optical Methods of Measurement

Sirohi, R: Optical Methods of Measurement Wholefield Techniques, Second Edition

Aus der Reihe Optical Science and Engineering

Fr. 349.00

inkl. gesetzl. MwSt., Versandkostenfrei

Beschreibung

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

26.06.2009

Abbildungen

400 11 Tables, black and white 128 Illustrations, black and white

Verlag

Taylor & Francis

Seitenzahl

316

Maße (L/B/H)

23.5/15.6/2 cm

Gewicht

589 g

Auflage

2 New edition

Sprache

Englisch

ISBN

978-1-57444-697-5

Beschreibung

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

26.06.2009

Abbildungen

400 11 Tables, black and white 128 Illustrations, black and white

Verlag

Taylor & Francis

Seitenzahl

316

Maße (L/B/H)

23.5/15.6/2 cm

Gewicht

589 g

Auflage

2 New edition

Sprache

Englisch

ISBN

978-1-57444-697-5

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  • Produktbild: Sirohi, R: Optical Methods of Measurement
  • Waves and Beams The Wave Equation Plane Waves Spherical Waves Cylindrical Waves Waves as Information Carriers The Laser Beam The Gaussian Beam ABCD Matrix Applied to Gaussian Beams Nondiffracting Beams—Bessel Beams Singular Beams Optical Interference Introduction Generation of Coherent Waves Interference between Two Plane Monochromatic Waves Multiple-Beam Interference Interferometry Diffraction Fresnel Diffraction Fraunhofer Diffraction Action of a Lens Image Formation and Fourier Transformation by a Lens Optical Filtering Optical Components in Optical Metrology Resolving Power of Optical Systems Phase-Evaluation Methods Interference Equation Fringe Skeletonization Temporal Heterodyning Phase-Sampling Evaluation: Quasi-Heterodyning Phase-Shifting Method Phase-Shifting with Unknown but Constant Phase-Step Spatial Phase-Shifting Methods of Phase-Shifting Fourier Transform Method Spatial Heterodyning Detectors and Recording Materials Detector Characteristics Detectors Image Detectors Recording Materials Holographic Interferometry Introduction Hologram Recording Reconstruction Choice of Angle of Reference Wave Choice of Reference Wave Intensity Types of Holograms Diffraction Efficiency Experimental Arrangement Holographic Recording Materials Holographic Interferometry (HI) Fringe Formation and Measurement of Displacement Vector Loading of the Object Measurement of Very Small Vibration Amplitudes Measurement of Large Vibration Amplitudes Stroboscopic Illumination/Stroboscopic HI Special Techniques in HI Extending the Sensitivity of HI Holographic Contouring/Shape Measurement Holographic Photo-Elasticity Digital Holography Digital HI Speckle Metrology The Speckle Phenomenon Average Speckle Size Superposition of Speckle Patterns Speckle Pattern and Object Surface Characteristics Speckle Pattern and Surface Motion Speckle Photography Methods of Evaluation Speckle Photography with Vibrating Objects: In-Plane Vibration Sensitivity of Speckle Photography Particle Image Velocimetry White-Light Speckle Photography Shear Speckle Photography Speckle Interferometry Correlation Coefficient in Speckle Interferometry Out-of-Plane Speckle Interferometer In-Plane Measurement: Duffy’s Method Filtering Arrangements for Extracting Information from Specklegram Out-of-Plane Displacement Measurement Simultaneous Measurement of Out-of-Plane and In-Plane Displacement Components Other Possibilities for Aperturing the Lens Duffy’s Arrangement: Enhanced Sensitivity Speckle Interferometry—Shape Measurement/Contouring Speckle Shear Interferometry Methods of Shearing Theory of Speckle Shear Interferometry Fringe Formation Shear Interferometry without Influence of the In-Plane Component Electronic Speckle Pattern Interferometry Contouring in ESPI Special Techniques Spatial Phase-Shifting Photo-Elasticity Superposition of Two-Plane Polarized Waves Linear Polarization Circular Polarization Production of Polarized Light Malus’s Law The Stress–Optic Law The Strain–Optic Law Methods of Analysis Evaluation Procedure Measurement of Fractional Fringe Order Phase-Shifting Birefringent Coating Method: Reflection Polariscope Holo-Photo-Elasticity Three-Dimensional Photo-Elasticity Examination of the Stressed Model in Scattered Light The Moiré Phenomenon Introduction The Moiré Fringe Pattern between Two Linear Gratings The Moiré Fringe Pattern between a Linear Grating and a Circular Grating Moiré between Sinusoidal Gratings Moiré between Reference and Deformed Gratings Moiré Pattern with Deformed Sinusoidal Grating Contrast Improvement of the Additive Moiré Pattern Moiré Phenomenon for Measurement Measurement of In-Plane Displacement Measurement of Out-of-Plane Component and Contouring Slope Determination for Dynamic Events Curvature Determination for Dynamic Events Surface Topography with Reflection Moiré Method Talbot Phenomenon Index Bibliography and Additional Reading appear at the end of each chapter.