Band 43
Structural Analysis of Point Defects in Solids An Introduction to Multiple Magnetic Resonance Spectroscopy
Aus der Reihe
Springer Series in Solid-State Sciences
-
- Englisch ausgewählt
Fr. 72.90
inkl. gesetzl. MwSt.,
Beschreibung
Produktdetails
Einband
Taschenbuch
Erscheinungsdatum
11.01.2012
Verlag
Springer BerlinSeitenzahl
367
Maße (L/B/H)
23.5/15.5/2.1 cm
Gewicht
581 g
Auflage
Softcover reprint of the original 1st ed. 1992
Sprache
Englisch
ISBN
978-3-642-84407-2
Strutural Analysis of Point Defects in Solids introduces the
principles and techniques of modern electron paramagnetic
resonance (EPR) spectroscopy essentialfor applications to
the determination of microscopic defect
structures. Investigations of the microscopic and electronic
structure, and also correlations with the
magnetic propertiesof solids, require various multiple
magnetic resonance methods, such as ENDOR and optically
detected EPR or ENDOR. This book discusses experimental,
technological and theoretical aspects of these techniques
comprehensively, from a practical viewpoint, with many
illustrative examples taken from semiconductors and other
solids. The nonspecialist is informed about the potential of
the different methods, while the researcher faced with the
task of determining defect structures isprovided with the
necessary tools, together with much information on
computer-aided methods of data analysis and the principles
of modern spectrometer design.
principles and techniques of modern electron paramagnetic
resonance (EPR) spectroscopy essentialfor applications to
the determination of microscopic defect
structures. Investigations of the microscopic and electronic
structure, and also correlations with the
magnetic propertiesof solids, require various multiple
magnetic resonance methods, such as ENDOR and optically
detected EPR or ENDOR. This book discusses experimental,
technological and theoretical aspects of these techniques
comprehensively, from a practical viewpoint, with many
illustrative examples taken from semiconductors and other
solids. The nonspecialist is informed about the potential of
the different methods, while the researcher faced with the
task of determining defect structures isprovided with the
necessary tools, together with much information on
computer-aided methods of data analysis and the principles
of modern spectrometer design.
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