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  • Produktbild: Electron Spectroscopy for Surface Analysis
  • Produktbild: Electron Spectroscopy for Surface Analysis
Band 4

Electron Spectroscopy for Surface Analysis

Aus der Reihe Topics in Current Physics

Fr. 137.00

inkl. gesetzl. MwSt., Versandkostenfrei

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

30.01.2012

Herausgeber

H. Ibach

Verlag

Springer Berlin

Seitenzahl

258

Maße (L/B/H)

24.4/17/1.6 cm

Gewicht

482 g

Auflage

Softcover reprint of the original 1st ed. 1977

Sprache

Englisch

ISBN

978-3-642-81101-2

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

30.01.2012

Herausgeber

H. Ibach

Verlag

Springer Berlin

Seitenzahl

258

Maße (L/B/H)

24.4/17/1.6 cm

Gewicht

482 g

Auflage

Softcover reprint of the original 1st ed. 1977

Sprache

Englisch

ISBN

978-3-642-81101-2

Herstelleradresse

Springer-Verlag KG
Sachsenplatz 4-6
1201 Wien
AT

Email: GPSR Kontakt

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  • Produktbild: Electron Spectroscopy for Surface Analysis
  • Produktbild: Electron Spectroscopy for Surface Analysis
  • 1. Introduction.- 1.1 Electron Spectroscopy and Its Importance in Surface Science.- 1.2 The Information Depth.- 1.3 Electron Spectroscopies.- References.- 2. Design of Electron Spectrometers for Surface Analysis.- 2.1 Specific Requirements of the Various Electron Spectroscopies for Surface Analysis.- 2.2 General Principles and Characteristics of Electron Spectrometers.- 2.2.1. Basic Principles of Energy Analysis.- 2.2.2. Characteristics Related to Energy Resolution and Sensitivity.- 2.2.3. Figures of Merit.- 2.3 Design Principles of Electron Spectrometers.- 2.3.1 Electron Optics for Energy Analysis.- 2.3.2 Optimization of Electron Monochromators and Analyzers.- 2.3.3 Detection Methods and Data Processing.- 2.3.4 Further Practical Considerations.- 2.4 Description of the Electron Spectrometers and the Methods of Energy Analysis for Surface Studies.- 2.4.1 Electrostatic Deflection Spectrometers.- 2.4.2 Magnetic Deflection Spectrometers.- 2.4.3 Crossed-Field Deflection Spectrometers.- 2.4.4 Retarding Potential Spectrometers.- 2.4.5 Other Techniques.- 2.5 Comparison of Electron Spectrometers.- 2.6 List of Abbreviations and Acronyms.- References.- 3. Electron-Excited Core Level Spectroscopies.- 3.1 Basic Processes.- 3.1.1 Free Atoms.- 3.1.2 Surface Atoms.- 3.2 Threshold Spectroscopies.- 3.2.1 Oberserving the Excitation: Disappearance Potential Spectroscopy (DAPS).- 3.2.2 Observing the Deexcitation.- 3.3 Ionization Loss Spectroscopy (ILS).- 3.4 Auger Electron Spectroscopy (AES).- 3.4.1 Influence of the Atomic Environment.- 3.4.2 Quantitative Auger Analysis.- 3.4.3 Auger Microanalysis.- 3.4.4 Combined Auger/X-Ray Microanalysis.- 3.5 Comparisons.- 3.5.1 Threshold Spectroscopies Inter Se.- 3.5.2 Threshold Spectroscopies Versus ILS.- 3.5.3 Elemental Analysis.- References.- 4. Electron Diffraction and Surface Defect Structure.- 4.1 Principles of Defect Detection by Electron Diffraction.- 4.1.1 Validity of the Kinematical Approximation.- 4.1.2 Construction and Calculation of the Ideal LEED Pattern.- 4.1.3 Instrumental Limitations.- 4.1.4 Diffraction Pattern of Simple Defect Structures.- 4.1.5 The Kind of Information in the Diffraction Pattern.- 4.2 Point Defects.- 4.2.1 Variation of Scattering Factor.- 4.2.2 Variation of Atom Position.- 4.3 Atomic Steps.- 4.3.1 Regular Step Arrays on Primitive Lattices.- 4.3.2 Irregular Step Arrays.- 4.3.3 Nonprimitive Lattices.- 4.3.4 Examples of Stepped Surfaces.- 4.4 Domains and Facets.- 4.4.1 Superstructures and Domains.- 4.4.2 LEED Patterns of Domain Structures.- 4.4.3 Quantitative Description of LEED Patterns.- 4.4.4 Facets.- 4.5 The Interpretation of a LEED Pattern.- 4.5.1 Parameters to be Observed.- 4.5.2 Interrelation of Defects and Effects.- References.- 5. Photoemission Spectroscopy.- 5.1 Principles of Photoemission.- 5.1.1 Parameters and Ranges.- 5.1.2 Basic Processes.- 5.2 Instrumentation.- 5.2.1 Light Sources.- 5.3 Theoretical and Practical Aspects.- 5.3.1 Electron Excitation and Emission.- 5.3.2 Surface Sensitivity.- 5.3.3 Relaxation and Chemical Shift.- 5.3.4 Photoemission from Adsorbates.- 5.4 Measurement Methods.- 5.4.1 Energy-Resolved Spectroscopy.- 5.4.2 Angle-Resolved Photoemission.- 5.4.3 Yield Spectroscopies.- 5.4.4 Spin-Polarized Photoemission.- References.- 6. Electron Energy Loss Spectroscopy.- 6.1 Definition of ELS.- 6.2 Theory of Inelastic Scattering.- 6.2.1 The Classical Theory (Concept of the “Dielectric Theory”).- 6.2.2 Quantum Mechanical Description of the Dielectric Theory.- 6.2.3 The Excitation of Optical Surface Phonons in Infrared-Active Material.- 6.2.4 Excitation of Optical Surface Phonoms on Noninfrared-Active Substrates.- 6.2.5 Excitation of Plasma Waves.- 6.2.6 Electronic Surface Transitions.- 6.2.7 Data Reduction.- 6.2.8 Anisotropic Effects of ELS.- 6.3 Experimental Studies of Surface Vibrations (Clean Surfaces).- 6.3.1 The Apparatus.- 6.3.2 Infrared Active Material.- 6.3.3 Noninfrared Active Material.- 6.4 Vibrational Modes on Gas-Covered Surfaces.- 6.4.1 Apparatus.- 6.4.2 Information.- 6.4.3 Oxygen Adsorption on Si (111) 2 × 1.- 6.4.4 Adsorption of Hydrogen on Si (111) 2 × 1.- 6.4.5 Hydrogen Adsorption on W(100).- 6.4.6 Adsorption of Oxygen on W(100).- 6.4.7 The Adsorption of CO on Tungsten (100).- 6.5 Experimental Studies of Electronic Transitions.- 6.5.1 The Apparatus.- 6.5.2 Relationship Between the Spectrometer and the Interpretation of the Loss Spectra.- 6.5.3 Excitations of Electronic Transitions at Clean Silicon Surfaces.- 6.5.4 Electronic Excitations at Ge(111) Surfaces.- 6.5.5 Galliurn Arsenide.- 6.5.6 Selection Rule Effects Observed at Ge and GaAs.- 6.5.7 Electronic Transitions at SiO and SiO2.- 6.6 Conclusion.- References.