Band 46
Nondestructive Evaluation of Semiconductor Materials and Devices
Aus der Reihe
NATO Science Series B:
-
- Taschenbuch ausgewählt
- eBook
-
Sprache:Englisch
Fr. 72.90
inkl. gesetzl. MwSt.,
Beschreibung
Produktdetails
Einband
Taschenbuch
Erscheinungsdatum
11.09.2013
Herausgeber
J. ZemelVerlag
Springer UsSeitenzahl
782
Maße (L/B/H)
24.4/17/4.3 cm
Gewicht
1346 g
Auflage
Softcover reprint of the original 1st ed. 1979
Sprache
Englisch
ISBN
978-1-4757-1354-1
From September 19-29, a NATO Advanced Study Institute on Non destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy. A total of 80 attendees and lecturers participated in the program which covered many of the important topics in this field. The subject matter was divided to emphasize the following different types of problems: electrical measurements; acoustic measurements; scanning techniques; optical methods; backscatter methods; x-ray observations; accele rated life tests. It would be difficult to give a full discussion of such an Institute without going through the major points of each speaker. Clearly this is the proper task of the eventual readers of these Proceedings. Instead, it would be preferable to stress some general issues. What came through very clearly is that the measurements of the basic scientists in materials and device phenomena are of sub stantial immediate concern to the device technologies and end users.
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