Scaling Effects on Metal-oxide-semiconductor Device Characteristics
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- Hardcover ausgewählt
- Taschenbuch
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Sprache:Englisch
Fr. 125.00
inkl. gesetzl. MwSt.,
Beschreibung
Produktdetails
Einband
Gebundene Ausgabe
Erscheinungsdatum
31.05.2019
Verlag
Dissertation Discovery CompanySeitenzahl
152
Maße (L/B/H)
28.6/22.1/1.3 cm
Gewicht
660 g
Sprache
Englisch
ISBN
978-0-530-00233-0
Dissertation Discovery Company and University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, "Scaling Effects on Metal-oxide-semiconductor Device Characteristics" by Steven V. Walstra, was obtained from University of Florida and is being sold with permission from the author. A digital copy of this work may also be found in the university's institutional repository, IR@UF. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation.
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