„jordi sune"
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Reliability Wearout Mechanisms in Advanced CMOS Technologies
Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune + weitere
Reliability Wearout Mechanisms in Advanced CMOS TechnologiesBuch (Gebundene Ausgabe) + weitere
Fr. 263.00
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Memristors for Neuromorphic Circuits and Artificial Intelligence Applications
Memristors for Neuromorphic Circuits and Artificial Intelligence ApplicationsBuch (Taschenbuch)
Fr. 106.00