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  • Produktbild: Advances in X-Ray Analysis
  • Produktbild: Advances in X-Ray Analysis
Band 30

Advances in X-Ray Analysis Volume 30

Aus der Reihe Advances in X-Ray Analysis

Fr. 130.00

inkl. gesetzl. MwSt., Versandkostenfrei

Beschreibung

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

05.03.1999

Abbildungen

XVIII, 602 p.

Verlag

Springer Us

Seitenzahl

602

Gewicht

1250 g

Auflage

1987

Sprache

Englisch

ISBN

978-0-306-42690-2

Beschreibung

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

05.03.1999

Abbildungen

XVIII, 602 p.

Verlag

Springer Us

Seitenzahl

602

Gewicht

1250 g

Auflage

1987

Sprache

Englisch

ISBN

978-0-306-42690-2

Herstelleradresse

Libri GmbH
Europaallee 1
36244 Bad Hersfeld
DE

Email: gpsr@libri.de

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  • Produktbild: Advances in X-Ray Analysis
  • Produktbild: Advances in X-Ray Analysis
  • I. Trends in XRF: A World Perspective (Plenary Session).- XRF in North America.- X-Ray Fluorescence Analysis (XRF) in Europe.- XRF in Japan and China.- Personal Observations.- Personal Observations.- II. XRF Techniques and Instrumentation.- X-Ray Microfluorescence of Geologic Materials.- Parameters Affecting X-Ray Microfluorescence (XRMF) Analysis.- Imaging Techniques for X-Ray Fluorescence and X-Ray Diffraction.- X-Ray Microanalysis for Alloy Design.- High Spatial Resolution in X-Ray Fluorescence.- Low Level Iodine Detection by TXRF in a Reactor Safety Simulation Experiment.- Robotic Automation Applied to X-Ray Fluorescence Analysis.- III. XRF Fundamental Parameters and Data Analysis.- Advances in Fundamental-Parameter Methods for Quantitative XRFA.- X-Ray Fluorescence Analysis of Geological Materials Using Rousseau’s Fundamental Algorithm.- Application of the Inverse Monte Carlo Method to Energy-Dispersive X-Ray Fluorescence.- Monte Carlo Simulation of the X-Ray Fluorescence Spectra From Multielement Homogeneous and Heterogeneous Samples.- Quantitative Analysis of Odd-Shaped Samples by X-Ray Fluorescence Spectrometry Using Intensity Ratios.- Background Intensities and their Utilization in Quantitative Analysis by Monochromatically Excited Energy-Dispersive X-Ray Fluorescence.- Standardless EDXRF Analysis of Cations in Ion-Exchange Resin-Impregnated Membrances.- Use of Scattered Secondary Target Radiation in EDXRF Analysis: A Fundamental-Parameter Method for Matrix Correction.- Comparison of Dilution Strategies for Dealing with Unanalyzed Elements in X-Ray Fluorescence Analyses.- IV. Recent Developments in XRF Dispersion Devices.- The Use of Layered Synthetic Microstructures for Quantitative Analysis of Elements: Boron to Magnesium.- The Analysis of Carbon and Other Light Elements Using Layered Synthetic Microstructures.- Layered Synthetic Microstructure in Sequential and Simultaneous X-Ray Spectrometry.- Measurement of Soft and Ultrasoft X-Rays With Total Reflection Monochromator.- Comparison of Dual-Channel Wavelength and Secondary-Target Energy-Dispersive X-Ray Spectrometers.- V. XRF Applications; Fuels and Lubricants, Metals and Alloys, Geological, Heavy Element, other.- The Efficiency of the Recessed Source Geometry for EDXRF Analysis of Metal Impurities in Oils.- X-Ray Fluorescence Analysis of Sulfur and Trace Elements in Coal and Oil Tar Pitches, Asphalts and Other Bituminous Compounds.- A Comparison of Several Sample Preparation Techniques for the Analysis of Fly Ash.- Advances in High-Resolution Studies of the Chemical Effects in the Molybdenum L Heavy-Ion-Induced X-Ray Satellite Emission (HIXSE) Spectra.- Energy Dispersive Analysis for Quality Assurance of Aluminum Alloys.- Multielement Preconcentration of Rare Earth Elements for their Determination at ppm-Levels in Geological Samples.- Wide Area Networking of XRF Generated Geochemical Data in a National Geological Survey.- Energy-Dispersive X-Ray Techniques for Accurate Heavy Element Assay..- Applications of X-Ray Fluorescence Scans of Single Strands of Hair: Actual and Potential.- Application of EDXRF Analysis to Continuous Industrial Process Monitoring.- X-Ray Fluorescence Determination of Trace Elements in Complicated Matrices.- An X-Ray Fluorescent Spectrometer for the Measurement of Thin Layered Materials on Silicon Wafers.- Automated Quantitative XRF Analysis of Soda-Lime Glass Utilizing Pattern Recognition.- VI. Quantitative Phase Analysis by XRD.- The Use of Mass Absorption in Quantitative X-Ray Diffraction Analysis.- Powder Diffraction Profiles and the Pearson VII Distribution.- Observed and Calculated XRPD Intensities for Single Substance Specimens.- Rapid Non-Destructive X-Ray Characterization of Solid Fuels/Propellents.- On-Stream X-Ray Diffraction Analyzer for Mineral Concentrators.- VII. Synchrotron and Neutron Diffraction.- Lattice Parameter Determination using Synchrotron Powder Data.- Synchrotron Radiation Applied to Computer Indexing.- Synchrotron X-Ray Scattering for the Structural Characterization of Catalysts.- Thermal Expansion Behavior of Pure and Doped Cordierite by Time-of-Flight Neutron Diffraction.- VIII. Advances in XRD Instrumentation and Procedures.- Instrumental Capabilities in X-Ray Diffraction Analysis: Comparative Techniques.- A New High-Temperature Camera for Diffraction Studies Above 2200°C ..- Use of X-Ray Curved Sensitive Position Detector for Simultaneous Measurement of Several Pole Figures.- A Quantitative Texture Analysis of Pluri-Crystals by Texture Goniometry.- Computing X-Ray Powder Diffraction Intensities and Bragg Angles Using a Microcomputer.- The Effects of Extinction on X-Ray Powder Diffraction Intensities.- Analysis of Surface Layers and Thin Films by Low Incident Angle X-Ray Diffraction.- IX, HIgh Temperature and Non-Ambient Powder Diffraction Applications.- X-Ray Diffraction Studies Under Non-Ambient Conditions: Application to Transition-Metal Dichalcogenide Solid Lubricants.- High Temperature X-Ray Diffraction Study of Sol-Gel Derived Pb(ZrxTi1-x)O3 Powders.- In Situ Crystallization Measurements on Fe-Zr Glasses Using an Automated High Temperature Diffractometer with a Position Sensitive Detector.- Use of Dow-Developed DSC/XRD/MS in the Study of Several Model Copper-Based Catalyst Systems.- Relationship Between Thermal Expansion and Crystal Chemical Parameters in Diborides.- X. X-Ray Stress Analysis, Fractography.- Experimental Methods for Determination of Precision and Estimation of Accuracy in XRD Residual Stress Measurement.- Design of a Real-Time Two-Dimensional Residual Stress Analyzer.- High Resolution Digital X-Ray Rocking Curve Topography.- X-Ray Diffraction Study of Fracture Surface Made by Fracture Toughness Tests of Blunt Notched CT Specimen of Aluminum Alloy.- X-Ray Fraetography of Fracture Surface of Alumina Ceramics.- XI, Analytical X-ray Safety (Workshop Presentations).- Dosimetry of X-Ray Beams: The Measure of the Problem.- Some Examples of Failure in X-Ray Safety.- Controlling Laboratory Conditions: Preventing the Problem, the Health Physicist’s Viewpoint.- Analytical X-Ray Safety at Lawrence Livermore National Laboratory.- Author Index.