Geschäftskunden Kundenprogramme
Vor Ort
Merkzettel Warenkorb
  • Produktbild: Image-Based Fractal Description of Microstructures
  • Produktbild: Image-Based Fractal Description of Microstructures

Image-Based Fractal Description of Microstructures

Fr. 138.00

inkl. gesetzl. MwSt., Versandkostenfrei

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

07.12.2010

Verlag

Springer Us

Seitenzahl

272

Maße (L/B/H)

23.5/15.5/1.6 cm

Gewicht

454 g

Auflage

Softcover reprint of hardcover 1st edition 2003

Sprache

Englisch

ISBN

978-1-4419-5370-4

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

07.12.2010

Verlag

Springer Us

Seitenzahl

272

Maße (L/B/H)

23.5/15.5/1.6 cm

Gewicht

454 g

Auflage

Softcover reprint of hardcover 1st edition 2003

Sprache

Englisch

ISBN

978-1-4419-5370-4

Herstelleradresse

Springer-Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

Email: GPSR Kontakt

Noch keine Bewertungen vorhanden

Verfassen Sie die erste Bewertung zu diesem Artikel

Helfen Sie anderen Kundinnen und Kunden durch Ihre Meinung.

Kundinnen und Kunden meinen

Bewertungen (0)
  • Produktbild: Image-Based Fractal Description of Microstructures
  • Produktbild: Image-Based Fractal Description of Microstructures
  • Preface. Acknowledgements.
    1: Introduction. 1.1. Classification of basic elements in microstructures. 1.2. Image and image processing. 1.3. Image-based measurement of basic elements. 1.4. Parameter estimation. 1.5. Relationship between properties and irregularity of microstructures of materials.
    2: Digital Images of Microstructures. 2.1. Light optical microscope. 2.2. Scanning electron microscope. 2.3. Transmission electron microscope. 2.4. Scanning tunnelling microscope. 2.5. Atomic force microscope. 2.6. Magnetic force microscope.
    3: Image Processing. 3.1. Image pre-processing. 3.2. Object abstraction. 3.3. Image post-processing.
    4: Fundamental Statistics. 4.1. Populations, sampling and probability. 4.2. Statistical measures for population. 4.3. Probability distribution. 4.4. Some useful theorems. 4.5. Simple linear regression analysis.
    5: Fractal Fundamentals. 5.1. Definitions of fractals. 5.2. Dimension. 5.3. Properties of a fractal set. 5.4. Examples of fractals.
    6: Fractal Measurements of Projection Microstructures. 6.1. Fractal measurements. 6.2. Length of fractal curve. 6.3. Perimeter-area and area-volume relations. 6.4. Mass method. 6.5. Box-counting method. 6.6. Multifractal measurements of cluster growth.
    7: Fractal Measurements of Topographical Images from 3D Surfaces. 7.1. Fractal nature of material surfaces. 7.2. Fractal-based methods for the description ofsurfaces. 7.3. Variation-correlation method for the description of 3D surfaces.
    8: Irregularity of Graphite Nodules. 8.1. Conventional description of nodules. 8.2. Measurement procedures. 8.3. Quantitative analysis.
    9: Fractal Growth of Graphite Nodules. 9.1. Growth of graphite nodules. 9.2. Fractal growth of graphite nodules. 9.3. Fractal growth models of graphite nodules. 9.4. Interpretation of fractal growth of graphite nodules.
    10: Fractal-based Study of Magnetic Thin Films. 10.1. Magnetic thin films. 10.2. Preparation of magnetic thin films. 10.3. Description of the surfaces of magnetic thin films. 10.4. Description of the magnetic microstructures of magnetic thin films.
    11: Fractal-based Study of Fracture Surfaces. 11.1. Fractography. 11.2. Fracture and fractals. 11.3. Physical meaning of the secondary electron image. 11.4. Influence of SEM parameters on Dcor. 11.5. Influence of noise on Dcor. 11.6. Fractal characteristics and mechanical properties. 11.7. Quantitative fractography. References. Index.