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Produktbild: Forces in Scanning Probe Methods
Band 286

Forces in Scanning Probe Methods

Aus der Reihe NATO Science Series E:

Fr. 359.00

inkl. gesetzl. MwSt., Versandkostenfrei

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

21.10.2012

Herausgeber

H.-J. Güntherodt + weitere

Verlag

Springer Netherland

Seitenzahl

644

Maße (L/B/H)

24/16/3.6 cm

Auflage

Softcover reprint of the original 1st ed. 1995

Sprache

Englisch

ISBN

978-94-010-4027-3

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

21.10.2012

Herausgeber

Verlag

Springer Netherland

Seitenzahl

644

Maße (L/B/H)

24/16/3.6 cm

Auflage

Softcover reprint of the original 1st ed. 1995

Sprache

Englisch

ISBN

978-94-010-4027-3

Herstelleradresse

Springer-Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

Email: ProductSafety@springernature.com

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  • Produktbild: Forces in Scanning Probe Methods
  • to Scanning Probe Methods.- The Nanometer Age: Challenge and Chance.- Instrumentation.- Scanning Probe Microscopy Instrumentation.- Low Temperature Scanning Force Microscopy.- Measuring Ultrafast Voltage Signals Using a Scanning Force Microscope.- Oscillating String as a Force Sensor in Scanning Force Microscopy.- Electrostatically Actuated Silicon Micromachined Sensors for Scanning Force Microscopy.- Effect of Overlayer Thickness on the Nanoindentation of SiO2 /Si.- Nanostethoscopy: a New Mode of Operation of the Atomic Force Microscope.- A Multi-Test Instrument Based on Scanning Probe Technologies.- Hydrophobic Surface Interactions Studied Using a Novel Force Microscope.- Imaging Loal Electric Forces in Organic Thin Films by Scanning Maxwell Stress Microscopy.- Simultaneous AFM and Local Conductivity Imaging.- Micromechanical Heat Sensor: Observation of a Chemical Reaction, Photon and Electrical Heat Pulses.- Theory.- Forces in Scanning Probe Microscopy.- Controlled Motion of Xe Atom on Metal Surfaces.- Van der Waals Forces and Probe Geometeries for Some Specific Scanning Force Microscopy Studies.- Atomistic Theory of the Interaction between AFM Tips and Ionic Surfaces.- Molecular Dynamics Simulation of Atomic-Scale Adhesion, Deformation, Friction, and Modification of Diamond Surfaces.- Simulation of SFM Images of Adsorbed C60 and C70 Molecule.- Metallic Adhesion.- Atomic-Scale Metal Adhesion.- Photons.- Photons and Forces I: Light Generates Force.- Photons and Forces II: Forces Influence Light.- Friction.- Interfacial Friction and Adhesion of Wetted Monolayers.- Coherent Phonon Generation in the Process of Friction.- Friction Force Microscopy.- Molecular Scale Study of Domain Boundaries and Frictional Stick-Slip Motion on Lipid Bilayers.- Two-Dimensional Atomic-ScaleFriction Observed with an AFM.- Normal and Lateral Forces in Friction Force Microscopy.- Nanotribology and Chemical Sensitivity on a Nanometer Scale.- Lateral Force Measurements on Phase Separated Polymer Surfaces.- Friction and Load on Well Defined Surfaces Studied by Atomic Force Microscopy.- Friction on an Atomic Scale.- Nano and Micromechanics.- Nanomechanics: Atomic Resolution and Frictional Energy Dissipation in Atomic Force Microscopy.- Nanotribology and its Applications to Magnetic Storage Devices and MEMS.- Lifetime Criteria of Macro- and Microtribological Systems.- Mechanical Property Evaluations of Solid Surfaces as a Technological Application of SPM.- Effects of Boundary Lubricants and Metallic Oxides in Steel-Steel Tribological Junctions Studied with the Atomic Force Microscope.- Magnetic Storage and Magnetic Forces.- High-Density Recording Technologies as an Application of SPM.- Applications of Magnetic Force Microscopy.- Magnetic Force Microscopy on Thin Film Magnetic Recording Media.- Analysis of Vortices in Superconductors by Scanning Probe Microscopy.- Applications.- Understanding Surface Chemical Processes in Environmental Contamination: New Applications for AFM.- Force Microscopy of Heavy Ion Irradiated Materials.- Atomic Force Microscopy as a Tool to Study Surface Roughness Effects In X-Ray Photoelectron Spectroscopy.- Atomic-Resolution Image of GaAs (110) Surface with an Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM).- Time dependence and its Spatial Distribution of Densely Contact-Electrified Electrons on a Thin Silicon Oxide.- Giant Atomic Corrugations on Layered Dichalcogenides Investigated by AFM/LFM.- Nanometer Scale Machining of Covalent Monolayers Investigated by Combined AFM/ LFM.- Atomic Resolution Imaging of ReS2 by AFM/LFM.- Ultra-High-Vacuum Atomic Force Microscopy in the Study of Model Catalysts.- AFM in Liquids AFM Observations of Si (111) in Solutions.- Atomic Scale Force Mapping with the Atomic Force Microscope.- Organics and Biology.- Imaging Chemical Bonds by SPM.- Study of Thin Organic Films by Various Scanning Force Microscopes.- Molecular Arrangement and Mechanical Stability of Self-Assembled Monolayers on Au (111) under Applied Load.- Organic Interface Inspection by Scanning Force Microscopy.- Atomic Force Microscopy of Biological Membranes: Current Possibilities and Prospects.- Biomolecule Photoimmobilization: Application in Scanning Probe Microscopy.- Measuring Molecular Adhesion with Force Microscopy.- Author-index.- Subject-index.