Reliability Of Power Gallium Nitride Based Transistors
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- Englisch ausgewählt
Fr. 31.90
inkl. gesetzl. MwSt.,
Beschreibung
Produktdetails
Einband
Taschenbuch
Erscheinungsdatum
18.07.2023
Verlag
Creative Media Partners, LLCSeitenzahl
224
Maße (L/B/H)
23.4/15.6/1.2 cm
Gewicht
318 g
Sprache
Englisch
ISBN
978-1-02-117785-8
In this cutting-edge study, Denis Marcon examines the reliability of power gallium nitride (GaN) based transistors. Using advanced simulation techniques and experimental data, he develops new models for predicting the reliability of these devices under various operating conditions. This book will be of particular interest to researchers and engineers working on power electronics and related fields.
This work has been selected by scholars as being culturally important, and is part of the knowledge base of civilization as we know it.
This work is in the "public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work.
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