Advances in X-Ray Analysis Volume 36
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- Hardcover
- Taschenbuch ausgewählt
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Sprache:Englisch
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Auflage:Softcover reprint of the original 1st ed. 1993
- Softcover reprint of the original 1st edition 1988 Fr. 72.90
- Softcover reprint of the original 1st edition 1985 Fr. 72.90
- Softcover reprint of the original 1st edition 1984 Fr. 72.90
- Softcover reprint of the original 1st edition 1987 Fr. 72.90
- Softcover reprint of the original 1st ed. 1962 Fr. 72.90
- Softcover reprint of the original 1st ed. 1961 Fr. 137.00
- Softcover reprint of the original 1st ed. 1960 Fr. 72.90
- Softcover reprint of the original 1st ed. 1960 Fr. 72.90
- Softcover reprint of the original 1st ed. 1982 Fr. 72.90
- Softcover reprint of the original 1st ed. 1965 Fr. 72.90
- Softcover reprint of the original 1st ed. 1964 Fr. 137.00
- Softcover reprint of the original 1st edition 1990 Fr. 72.90
- Softcover reprint of the original 1st ed. 1963 Fr. 72.90
- 1991 Fr. 72.90
- Softcover reprint of the original 1st ed. 1969 Fr. 72.90
- Softcover reprint of the original 1st ed. 1967 Fr. 72.90
- Softcover reprint of the original 1st ed. 1994 Fr. 72.90
- Softcover reprint of the original 1st ed. 1993 Fr. 72.90 ausgewählt
- Softcover reprint of the original 1st ed. 1992 Fr. 72.90
- 1966 Fr. 72.90
Fr. 72.90
inkl. gesetzl. MwSt.,
Beschreibung
Produktdetails
Einband
Taschenbuch
Erscheinungsdatum
24.10.2012
Abbildungen
XXIII, 685 p.
Herausgeber
John V. Gilfrich + weitereVerlag
Springer UsSeitenzahl
685
Maße (L/B/H)
25.4/17.8/3.8 cm
Gewicht
1315 g
Auflage
Softcover reprint of the original 1st ed. 1993
Sprache
Englisch
ISBN
978-1-4613-6293-7
The 41st Annual Conference on Applications of X-Ray Analysis was held August 3-7, 1992, at the Sheraton Colorado Springs Hotel, Colorado Springs, Colorado. The Conference is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for further developments. In recent years, one of the most exciting and important developments in the x-ray field has been the applications of grazing-incidence x-rays for surface and thin-film analysis. To introduce the conference attendees to these "leading-edge" developments, the topic for the Plenary Session was "Grazing-Incidence X Ray Characterization of Materials. " The Conference had the privilege of inviting leading experts in the field of x-ray thin film analysis to deliver lectures at the Plenary Session. Dr. D. K. Bowen, University of Warwick, U. K. , opened the session with a lecture on "Grazing Incidence X-Ray Scattering from Thin Films. " He reviewed and compared grazing incidence diffraction, fluorescence and reflectivity techniques. Results of experimental and theoretical analysis were also discussed. Dr. B. Lenge1er, Forchungszentrum Ju1ich, Germany, followed with a lecture on "Grazing Incidence Diffuse X-Ray Scattering from Thin Films. " He concentrated on the use of newly developed "off-specular" reflectivity techniques for the determination of vertical roughness, lateral correlation length and contour exponent on surfaces.
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