Band 9
Advances in X-Ray Analysis Volume 9 Proceedings of the Fourteenth Annual Conference on Applications of X-Ray Analysis Held August 25–27, 1965
Aus der Reihe
Advances in X-Ray Analysis
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- Hardcover
- Taschenbuch ausgewählt
- eBook
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Sprache:Englisch
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Auflage:1966
- Softcover reprint of the original 1st edition 1988 Fr. 72.90
- Softcover reprint of the original 1st edition 1985 Fr. 72.90
- Softcover reprint of the original 1st edition 1984 Fr. 72.90
- Softcover reprint of the original 1st edition 1987 Fr. 72.90
- Softcover reprint of the original 1st ed. 1962 Fr. 72.90
- Softcover reprint of the original 1st ed. 1961 Fr. 137.00
- Softcover reprint of the original 1st ed. 1960 Fr. 72.90
- Softcover reprint of the original 1st ed. 1960 Fr. 72.90
- Softcover reprint of the original 1st ed. 1982 Fr. 72.90
- Softcover reprint of the original 1st ed. 1965 Fr. 72.90
- Softcover reprint of the original 1st ed. 1964 Fr. 137.00
- Softcover reprint of the original 1st edition 1990 Fr. 72.90
- Softcover reprint of the original 1st ed. 1963 Fr. 72.90
- 1991 Fr. 72.90
- Softcover reprint of the original 1st ed. 1969 Fr. 72.90
- Softcover reprint of the original 1st ed. 1967 Fr. 72.90
- Softcover reprint of the original 1st ed. 1994 Fr. 72.90
- Softcover reprint of the original 1st ed. 1993 Fr. 72.90
- Softcover reprint of the original 1st ed. 1992 Fr. 72.90
- 1966 Fr. 72.90 ausgewählt
Fr. 72.90
inkl. gesetzl. MwSt.,
Beschreibung
Produktdetails
Einband
Taschenbuch
Erscheinungsdatum
08.10.2012
Abbildungen
IX, 544 p. 206 illus., 12 illus. in color.
Verlag
Springer UsSeitenzahl
544
Maße (L/B/H)
25.4/17.8/3 cm
Gewicht
1040 g
Auflage
1966
Sprache
Englisch
ISBN
978-1-4684-7635-4
The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.
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