Band 12
Advances in X-Ray Analysis Volume 12: Proceedings of the Seventeenth Annual Conference on Applications of X-Ray Analysis Held August 21–23, 1968
Aus der Reihe
Advances in X-Ray Analysis
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- Hardcover
- Taschenbuch ausgewählt
- eBook
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Sprache:Englisch
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Auflage:Softcover reprint of the original 1st ed. 1969
- Softcover reprint of the original 1st edition 1988 Fr. 72.90
- Softcover reprint of the original 1st edition 1985 Fr. 72.90
- Softcover reprint of the original 1st edition 1984 Fr. 72.90
- Softcover reprint of the original 1st edition 1987 Fr. 72.90
- Softcover reprint of the original 1st ed. 1962 Fr. 72.90
- Softcover reprint of the original 1st ed. 1961 Fr. 137.00
- Softcover reprint of the original 1st ed. 1960 Fr. 72.90
- Softcover reprint of the original 1st ed. 1960 Fr. 72.90
- Softcover reprint of the original 1st ed. 1982 Fr. 72.90
- Softcover reprint of the original 1st ed. 1965 Fr. 72.90
- Softcover reprint of the original 1st ed. 1964 Fr. 137.00
- Softcover reprint of the original 1st edition 1990 Fr. 72.90
- Softcover reprint of the original 1st ed. 1963 Fr. 72.90
- 1991 Fr. 72.90
- Softcover reprint of the original 1st ed. 1969 Fr. 72.90 ausgewählt
- Softcover reprint of the original 1st ed. 1967 Fr. 72.90
- Softcover reprint of the original 1st ed. 1994 Fr. 72.90
- Softcover reprint of the original 1st ed. 1993 Fr. 72.90
- Softcover reprint of the original 1st ed. 1992 Fr. 72.90
- 1966 Fr. 72.90
Fr. 72.90
inkl. gesetzl. MwSt.,
Beschreibung
Produktdetails
Einband
Taschenbuch
Erscheinungsdatum
29.04.2012
Abbildungen
X, 648 p. 213 illus.
Verlag
Springer UsSeitenzahl
648
Maße (L/B/H)
25.4/17.8/3.6 cm
Gewicht
1228 g
Auflage
Softcover reprint of the original 1st ed. 1969
Sprache
Englisch
ISBN
978-1-4684-7537-1
The University of Denver and its staff members deserve much credit for organizing and operating this Denver X-ray Conference year after year, for there seems to be no doubt that it and the yolumes that result from it are filling a need. The interests covered by the papers at one of these conferences vary from year to year and as a whole cover a wide spread of topics. This is as it should be. Old problems that have been with us for many years are being attacked again with new and more effective tools, new problems are continually arising, and new methods of great power are being developed. These developments are occurring in each of the fields covered, as may readily be seen by a glance at this twelfth volume and other recent volumes of this series. It seems clear that the policy of having these conferences and these volumes cover a wide field rather than a single one such as, for example, structure determination, or fluorescence analysis, is a policy that meets with general approval and should be continued. I understand there is every intention to do so. C. S. Barrett It is customary to acknowledge in each volume the invited session chairmen of the three-day meeting. They and the sessions at which they presided (21-23 August 1968) were as follows: CRYSTALLOGRAPHY AND DIFFRACTION. C. S. Barrett, University of Chicago, Chicago, Illinois. METHODS AND THEIR APPLICATIONS. B. C. Giessen, Massachusetts Institute of Technology, Cambridge, Massachusetts.
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