Band 2
Advances in X-Ray Analysis Volume 2 Proceedings of the Seventh Annual Conference on Applications of X-Ray Analysis Held August 13–15, 1958
Aus der Reihe
Advances in X-Ray Analysis
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- Hardcover
- Taschenbuch ausgewählt
- eBook
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Sprache:Englisch
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Auflage:Softcover reprint of the original 1st ed. 1960
- Softcover reprint of the original 1st edition 1988 Fr. 72.90
- Softcover reprint of the original 1st edition 1985 Fr. 72.90
- Softcover reprint of the original 1st edition 1984 Fr. 72.90
- Softcover reprint of the original 1st edition 1987 Fr. 72.90
- Softcover reprint of the original 1st ed. 1962 Fr. 72.90
- Softcover reprint of the original 1st ed. 1961 Fr. 137.00
- Softcover reprint of the original 1st ed. 1960 Fr. 72.90
- Softcover reprint of the original 1st ed. 1960 Fr. 72.90 ausgewählt
- Softcover reprint of the original 1st ed. 1982 Fr. 72.90
- Softcover reprint of the original 1st ed. 1965 Fr. 72.90
- Softcover reprint of the original 1st ed. 1964 Fr. 137.00
- Softcover reprint of the original 1st edition 1990 Fr. 72.90
- Softcover reprint of the original 1st ed. 1963 Fr. 72.90
- 1991 Fr. 72.90
- Softcover reprint of the original 1st ed. 1969 Fr. 72.90
- Softcover reprint of the original 1st ed. 1967 Fr. 72.90
- Softcover reprint of the original 1st ed. 1994 Fr. 72.90
- Softcover reprint of the original 1st ed. 1993 Fr. 72.90
- Softcover reprint of the original 1st ed. 1992 Fr. 72.90
- 1966 Fr. 72.90
Fr. 72.90
inkl. gesetzl. MwSt.,
Beschreibung
Produktdetails
Einband
Taschenbuch
Erscheinungsdatum
10.10.2013
Abbildungen
VI, 353 p. 106 illus.
Verlag
Springer UsSeitenzahl
353
Maße (L/B/H)
22.9/15.2/2 cm
Gewicht
522 g
Auflage
Softcover reprint of the original 1st ed. 1960
Sprache
Englisch
ISBN
978-1-4684-8633-9
The original scope of the annual conference on industrial applications of x-ray analysis envisioned almost total participation by representatives from industrial laboratories_ These people were concerned with problems of an immediate nature and thus welcomed the opportunity to meet for a few days with associates from other laboratnries in order to discuss problems of a similar nature, as weH as to interchange information freely and rapidly_ Certainly, this was true during the first few years of the conference's existence. During the past few years, however, a rather subtle blending has occur red of representatives from industrial laboratories, universities, and manu facturers of x-ray equipment. Papers which deal with the fundamental as pects of some phase of x-ray research and which, in many cases, have no end or ultimate objective, are as eagerly received by the conferees as are papers which deal with a specific problem of immediate importance or a paper in which the la test equipment available is portrayed. In our opinion, this x-ray conference, while perhaps no longer slanted specificaHy toward industrial applications of x-ray techniques, does continue to serve the same purpose as a medium of interchange of the latest available information and at the same time provide an opportunity for basic researchers, applied researchers and manufacturing representatives to become acquainted with each other's problems.
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